Inspectis BGA Inspection System Bacis, Side-view

Side-view Optical System for BGA Inspection

Superior Optical Performance

New generation side-view BGA inspection system, designed for easy and flexible inspection, analysis and documentation of hidden solder joints of BGA, μBGA. FipChip, CSP, CGA and top-view SMD components.

Powered by INSPECTIS© Basic

Powerful still easy-to-use software providing tools for live image view, image capture, advance camera controls, geometrical measurements, image comparision and documentation.

Developed for Productivity and Cost Efficiency

Basic system configured with a robust high resolution optical probe and Inspectis fast 5.0MP, USB3.0 digital microscope. Deliveted with an innovative stand and background lighting system.